A very low level of magnetic field exposure does not affect a participant's mental fatigue and stress as much as VDT work - Ishihara I; Ikushima M; Horikawa J; Haraga M; Kawamoto R; Murase C; Tashiro T; Tsutsui Y; Kawashima M; Kasai H; Yamazaki S; Majima Y; et al. (Journal of UOEH, 2005)
FEMU ID: 11797; EMF-Portal URL: https://www.emf-portal.org/en/article/11797