TY - JOUR IS - 12 JA - AIEE Transactions JO - Transactions of the American Institute of Electrical Engineers PY - 1943 VL - 62 AU - Dalziel CF AU - Ogden E AU - Abbott CE LA - en N1 - FEMU ID: 20508; EMF-Portal URL: https://www.emf-portal.org/en/article/20508 SP - 745-750 TI - Effect of frequency on let-go currents ER -