TY - JOUR IS - 1 JA - IEEE Electromagn Compat Mag JO - IEEE Electromagnetic Compatibility Magazine PY - 2014 SN - 2162-2264 VL - 3 AU - Seidman SJ AU - Pantchenko O AU - Tennakoon D DO - 10.1109/MEMC.2014.6798800 LA - en N1 - FEMU ID: 25031; EMF-Portal URL: https://www.emf-portal.org/en/article/25031 SP - 70-74 TI - Design of unique simulators to evaluate medical device susceptibility to radio frequency identification exposure ER -