Current pathways in high-voltage injuries - Sances Jr A; Myklebust JB; Szablya JF; Swiontek TJ; Larson SJ; Chilbert M; Prieto T; Cusick JF; Maiman DJ; Pintar K (IEEE Transactions on Biomedical Engineering, 1983)
FEMU ID: 28002; EMF-Portal URL: https://www.emf-portal.org/en/article/28002