Characterization of Pressure Transients Generated by Nanosecond Electrical Pulse (nsEP) Exposure - Roth CC; Barnes Jr RA; Ibey BL; Beier HT; Christopher Mimun L; Maswadi SM; Shadaram M; Glickman RD (Scientific Reports, 2015)
FEMU ID: 28039; EMF-Portal URL: https://www.emf-portal.org/en/article/28039