Exposure to electromagnetic fields in the surrounding area of microtomograph for the frequency of 50Hz - Michałowska J; Józwik J; Mika D; Krawczyk A (IEEE EUROCON 2017 -17th International Conference on Smart Technologies, 2017)
FEMU ID: 32974; EMF-Portal URL: https://www.emf-portal.org/en/article/32974