Non-ionizing EMF hazard in the 21th century - Koh WJ; Moochhala SM (2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), 2018)
FEMU ID: 35394; EMF-Portal URL: https://www.emf-portal.org/en/article/35394