Solutions for EM exposure assessment of 5G wireless devices - Douglas MG; Pfeifer S; Kuehn S; Neufeld E; Pokovic K; Carrasco E; Samaras T; Christ A; Capstick M; Kuster N (2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), 2018)
FEMU ID: 35407; EMF-Portal URL: https://www.emf-portal.org/en/article/35407