The Features of the Stress-Reaction to Repetitive Nanosecond Microwave Pulses - Knyazeva IR; Medvedev MA; Kutenkov OP; Vasilev AV; Gorokhovsky AA; Rostov VV (2018 20th International Symposium on High-Current Electronics (ISHCE), 2018)
FEMU ID: 36665; EMF-Portal URL: https://www.emf-portal.org/en/article/36665