[Long term power frequency electromagnetic fields exposure influences the causal network connection pattern of local field potentials during working memory] - Li S; Wen X; Sang H; Xu G (Journal of Biomedical Engineering (Sheng Wu Yi Xue Gong Cheng Xue Za Zhi), 2018)
FEMU ID: 36983; EMF-Portal URL: https://www.emf-portal.org/en/article/36983