Effects of Selecting the Fitting Range for SAR Probe Calibration in Waveguide System - Ishii N; Shimizu Y; Nagaoka T; Watanabe S (2018 IEEE International Workshop on Electromagnetics:Applications and Student Innovation Competition (iWEM), 2018)
FEMU ID: 39496; EMF-Portal URL: https://www.emf-portal.org/en/article/39496