The Effect of Static Magnetic Field Exposure to Drivers Cognitive Ability - He Y; Leung PSW (2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), 2019)
FEMU ID: 40631; EMF-Portal URL: https://www.emf-portal.org/en/article/40631