Near Field Exposure Conditions by UHF-RFID Systems in Smart Healthcare Environments - De Miguel-Bilbao S; Hernandez JA; Suarez OJ; Marina P; Febles VM; Rabassa LE; Suarez S; Karpowicz J; Zradzinski P; Gryz K; Aguirre E; Ramos V (2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 2021)
FEMU ID: 45838; EMF-Portal URL: https://www.emf-portal.org/en/article/45838