TY - JOUR JO - IEEE Access PY - 2022 SN - 2169-3536 VL - 10 AU - Cho Y AU - Yoo H DO - 10.1109/ACCESS.2022.3180494 LA - en N1 - FEMU ID: 47614; EMF-Portal URL: https://www.emf-portal.org/en/article/47614 SP - 60946-60954 TI - Numerical Analysis of RF-induced Heating while Wearing Face Mask at Magnetic Resonance Imaging UR - https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9789101 ER -