Validation of Computational Models of Wireless Devices by Comparing Measured and Simulated One-port Quantities due to Near-field Perturbations - Horváth P; Pávó J; Badics Z; Horváth BP (2023 Photonics & Electromagnetics Research Symposium (PIERS), 2023)
FEMU ID: 51584; EMF-Portal URL: https://www.emf-portal.org/en/article/51584