High Noon for Mobile Networks: Short-Time EMF Measurements to Capture Daily Exposure - Adda S; Chiaraviglio L; Franci D; Lodovisi C; Pasquino N; Pavoncello S; Pedroli C; Pelosini R (IEEE Transactions on Instrumentation and Measurement, 2023)
FEMU ID: 52032; EMF-Portal URL: https://www.emf-portal.org/en/article/52032