Analysis of the Effects of High-Voltage Transmission Line on Human Stress and Attention Through Electroencephalography (EEG) - Aliyari H; Hosseinian SH; Menhaj MB; Sahraei H (Iranian Journal of Science and Technology - Transactions of Electrical Engineering, 2019)
FEMU ID: 52699; EMF-Portal URL: https://www.emf-portal.org/en/article/52699