Joint Data Rate and EMF Exposure Analysis in Manhattan Environments: Stochastic Geometry and Ray Tracing Approaches - Wiame C; Demey S; Vandendorpe L; De Doncker P; Oestges C (IEEE Transactions on Vehicular Technology, 2024)
FEMU ID: 54329; EMF-Portal URL: https://www.emf-portal.org/en/article/54329