The Effect of Lead Winding Near IPG on AIMD Models under MR RF Exposure - Zuo Z; Wang Q; Zheng J; Jeong H; Kumar A; Chen J (2024 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI), 2024)
FEMU ID: 56381; EMF-Portal URL: https://www.emf-portal.org/en/article/56381