Optimizing the Electrical Microenvironment Provided by 3D Micropillar Topography on a Piezoelectric BaTiO3 Substrate to Enhance Osseointegration - Sun X; Guo Y; Zheng X; Bai Y; Lu Y; Yang X; Cai Z; Xu E; He Y; Heng BC; Xu M; Deng X; et al. (Advanced Materials, 2025)
FEMU ID: 57086; EMF-Portal URL: https://www.emf-portal.org/en/article/57086