Use of a Bacterial Gene Expression System for Mutation Repairing (UMU System) to Evaluate Damage in DNA Molecules Resulting from Exposure to Extremely Low Frequency Magnetic Field - Haga A; Kumagai Y; Endo G (EMC Europe 2000 Brugge, 4th European Symposium on Electromagnetic Compatibility, 2000)
FEMU ID: 57614; EMF-Portal URL: https://www.emf-portal.org/en/article/57614