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2019,
Kainz A, Steiner H, Hortschitz W, Schalko J, Jachimowicz A, Keplinger F
2019 20th International Conference on Solid-State Sensors, Actuators and Microsystems & Eurosensors XXXIII (TRANSDUCERS & EUROSENSORS XXXIII), Berlin, Germany. IEEE: 2114-2117; ISBN 978-1-5386-8105-3
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2019,
Mohammad M, Pries J, Onar O, Galigekere VP, Su GJ, Anwar S, Wilkins J, Kavimandan UD, Patil D
2019 IEEE Applied Power Electronics Conference and Exposition (APEC), Anaheim, CA, USA. IEEE: 1521-1527; ISBN 978-1-5386-8331-6
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2018,
Kölbl F, Boulboul N, Commereuc M, Bourdel E
2018 12th International Conference on Sensing Technology (ICST), Limerick, Ireland. IEEE: 319-323; ISBN 978-1-5386-5148-3
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2018,
Acharya R, Kumar D, Mathur G
Janyani V, Tiwari M, Singh G, Minzioni P (Hrsg.): Optical and Wireless Technologies. Lecture Notes in Electrical Engineering, Band 472; Springer, Singapore; 497-505; ISBN 978-981-10-7394-6
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2018 8th International Conference on Intelligent Systems, Modelling and Simulation (ISMS), Kuala Lumpur, Malaysia. IEEE: 62-66; ISBN 978-1-5386-6540-4
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2018,
Teplan M, Bereta M, Bajla I, Bartosova K, Dermek T, Haba Y, Cifra M
2018 EMF-Med 1st World Conference on Biomedical Applications of Electromagnetic Fields (EMF-Med), Split, Croatia. IEEE: 1-2; ISBN 978-1-5386-5922-9
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2018,
Wang F, Wang Y, Huang T, Guo F, Liu J, Song Z, Weng Z, Wang Z, Wang Z
2017 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), Shanghai, China. IEEE: 174-177; ISBN 978-1-5386-1082-4
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2018,
Staigvila G, Novickij V
2017 5th IEEE Workshop on Advances in Information, Electronic and Electrical Engineering (AIEEE), Riga, Latvia. IEEE: 1-3; ISBN 978-1-5386-4138-5
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2018,
Stam R, Karipidis K, Abramowicz J, D'Inzeo G, Green A, Miller S, Okuno T, Toivo T
2018 EMF-Med 1st World Conference on Biomedical Applications of Electromagnetic Fields (EMF-Med), Split, Croatia. IEEE: 1-2; ISBN 978-1-5386-5922-9
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2018,
Sitnikov DS, Ilina IV, Pronkin AA, Zurina IM, Gorkun AA, Khramova YV, Kosheleva NV
International Conference Laser Optics (ICLO), 2018. IEEE: 456; ISBN 978-1-5386-3613-8