Die folgenden Begriffe wurden einbezogen:
Schwellenwert, "threshold value", threshold, 閾値
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2023,
Zinno C, Agnesi F, Bernini F, Gabisonia K, Terlizzi D, Recchia FA, Lionetti V, Micera S
2023 45th Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Sydney, Australia. IEEE: S. 1-4; ISBN 9798350324488
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2023,
Galanis C, Neuhaus L, Hananeia N, Turi Z, Jedlicka P, Vlachos A
bioRxiv: the Preprint Server for Biology (bioRxiv),
2023.09.25.559399
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2023,
Ikehata M, Suzuki Y, Kamijyo T, Kik A, Yoshie S, Tasaki T, Kojima M, Sasaki H
2023 XXXVth General Assembly and Scientific Symposium of the International Union of Radio Science (URSI GASS), Sapporo, Japan. IEEE: S. 1-2; ISBN 9798350309973
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2023,
Mahapatra S, Satrusallya S, Mohanty MN
2023 International Conference on Microwave, Optical, and Communication Engineering (ICMOCE), Bhubaneswar, India. IEEE: S. 1-4; ISBN 9798350321616
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2023,
Salma S, Khan H, Madhav BTP, Sathwik B, Praveen Koushik SSD, Arun Harsha Vardhan P
2023 Second International Conference on Electrical, Electronics, Information and Communication Technologies (ICEEICT), Trichirappalli, India. IEEE: S. 1-5; ISBN 9798350397642
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2022,
Gordon LB, Liechty J, Bradley J, Merrill L, Gauss H
2022 IEEE IAS Electrical Safety Workshop (ESW), Jacksonville, FL, USA. IEEE: S. 1-8; ISBN 978-1-6654-7864-9
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2022,
Ma F, Liu X, Ansari N
GLOBECOM 2022 - 2022 IEEE Global Communications Conference, Rio de Janeiro, Brazil. IEEE: S. 4995-5000; ISBN 978-1-6654-3541-3
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2022,
Yamamoto K, Hikage T, Masuda H, Ishitake T, Li K, Nagai A
2022 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition (iWEM), Narashino, Japan. IEEE: S. 37-38; ISBN 978-1-6654-3239-9
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2022,
Nourredine T, Rabah D, Abdechafik H
2022 19th International Multi-Conference on Systems, Signals & Devices (SSD), Sétif, Algeria. IEEE: S. 1813-1819; ISBN 978-1-6654-7109-1
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2022,
Hannig M, Brocke R, Shulzhenko E
2022 36th International Conference on Lightning Protection (ICLP), Cape Town, South Africa. IEEE: S. 648-653; ISBN 978-1-6654-9025-2