The following terms were included:
"Very High Frequency", Ultrakurzwellen, Meterwellen, UKW, VHF
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2022,
Annalakshmi N, Umarani S
2022 1st International Conference on Computational Science and Technology (ICCST), CHENNAI, India. IEEE: 701-707; ISBN 978-1-6654-7656-0
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2022,
Matveev I, Zhorina L, Shishkin Y
2022 IEEE International Multi-Conference on Engineering, Computer and Information Sciences (SIBIRCON), Yekaterinburg, Russian Federation. IEEE: 440-445; ISBN 978-1-6654-6481-9
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2022,
Kundenko M, Chaly I, Vakhonina L, Megel Y, Rudenko A, Mardziavko V
2022 XXXII International Scientific Symposium Metrology and Metrology Assurance (MMA), Sozopol, Bulgaria. IEEE: 1-4; ISBN 978-1-6654-8570-8
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2022,
Sekiya K, Ishii N, Shimizu Y, Nagaoka T
2022 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition (iWEM), Narashino, Japan. IEEE: 79-80; ISBN 978-1-6654-3239-9
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2022,
Vilagosh Z, Appadoo D, Perera PGT, Nguyen THP, Linklater D, Juodkazis S, Croft R, Ivanova E
2022 7th International Conference on Intelligent Informatics and Biomedical Science (ICIIBMS), Nara, Japan. IEEE: 367-369; ISBN 978-1-6654-8230-1
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2022,
Umamaheswari G, Praveena A
2022 International Conference on Intelligent Innovations in Engineering and Technology (ICIIET), Coimbatore, India. IEEE: 118-123; ISBN 978-1-6654-5654-8
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2022,
Uthayakumar U, Jayaweera Y
2022 IEEE Symposium on Wireless Technology & Applications (ISWTA), Kuala Lumpur, Malaysia. IEEE: 62-67; ISBN 978-1-6654-8483-1
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2022,
Shbanah M, Kovács TA
Kovács TA, Nyikes Z, Fürstner I (eds.): Security-Related Advanced Technologies in Critical Infrastructure Protection: Theoretical and Practical Approach. NATO Science for Peace and Security Series C: Environmental Security; Springer, Dordrecht; 161-167; ISBN 978-94-024-2176-7
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2022 International Symposium on Electromagnetic Compatibility – EMC Europe, Gothenburg, Sweden. IEEE: 145-150; ISBN 978-1-6654-0789-2
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2022 International Symposium on Electromagnetic Compatibility – EMC Europe, Gothenburg, Sweden. IEEE: 311-316; ISBN 978-1-6654-0789-2