The following terms were included:
"root mean square value", Effektivwert, "effective value", rms-value, 二乗平均平方根値, rms値
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2024,
Poljak D, Šušnjara A
Poljak D, Šušnjara A: Deterministic and Stochastic Modeling in Computational Electromagnetics: Integral and Differential Equation Approaches. IEEE Press Series on Electromagnetic Wave Theory; Wiley-IEEE Press: 207-284; ISBN 978-1-119-98924-0
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2023,
Gryz K, Karpowicz J, Zradziński P
2023 International Symposium on Electromagnetic Compatibility – EMC Europe, Krakow, Poland. IEEE: 1-5; ISBN 9798350324013
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2023,
Liu S, Tsuchiya N, Onishi T, Taki M, Watanabe S, Suzuki Y
2023 XXXVth General Assembly and Scientific Symposium of the International Union of Radio Science (URSI GASS), Sapporo, Japan. IEEE: 1-3; ISBN 9798350309973
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2023 IEEE International Symposium on Product Compliance Engineering (ISPCE), Dallas, TX, USA. IEEE: 1-5; ISBN 978-1-6654-5679-1
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2021,
Zheng C, Chen X, Nguyen BT, Sanpitak P, Vu J, Bagci U, Golestanirad L
2021 43rd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Mexico. IEEE: 4204-4208; ISBN 978-1-7281-1179-7
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2021,
Judáková Z, Janoušek L, Čarnecká L, Oreničová D
2021 22nd International Conference on Computational Problems of Electrical Engineering (CPEE), Hrádek u Sušice, Czech Republic. IEEE: 1-4; ISBN 978-1-7281-8431-9
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2020,
Winkler SA, Saniour I, Chaudhari A, Robb F, Vaughan JT
2020 IEEE MTT-S International Microwave Biomedical Conference (IMBioC), Toulouse, France. IEEE: 1-3; ISBN 978-1-7281-5867-9
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2020,
Salceanu A, Vornicu S, Bordeianu DF, Neagu CD
2020 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: 674-679; ISBN 978-1-7281-8127-1
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2019,
Harimurugan D, Punekar GS, Kishore NK
2019 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics (DISCOVER), Manipal, India. IEEE: 1-5; ISBN 978-1-7281-3736-0
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2019,
Lan Q, Zheng J, Chen J
2019 IEEE International Symposium on Antennas and Propagation and USNC-URSI Radio Science Meeting, Atlanta, GA, USA. IEEE: 1861-1862; ISBN 978-1-7281-0693-9