Literature search results

73 articles were found.

The following terms were included: 米国国家規格協会, "American National Standards Institute", ANSI

• 2023
  An Introduction to Non-Ionizing Radiation [basics]
  Maqbool M (ed.): Bentham Science Publisher, Singapore; ISBN 978-981-5136-90-6
• 2022, Marinescu A, Morega M
  Exposure of Active Medical Implants Bearers to Electromagnetic Emissions From Wireless Power Transfer Systems [misc.]
  Rev Roum Sci Techn – Électrotechn et Énerg 67 (2): 213-218
• 2022
  IEEE Recommended Practice for Antenna Measurements [guideline]
  Institute of Electrical and Electronics Engineers (IEEE), IEEE Std 149-2021: 1-207, ISBN 978-1-5044-8017-8
• 2021, American National Standards Institute (ANSI)
  American National Standard for Methods of Measurements of Radio-Frequency Emissions from Wireless Power Transfer Equipment [guideline]
  Institute of Electrical and Electronics Engineers (IEEE), ANSI C63.30-2021, ISBN 978-1-5044-7803-8
• 2020
  Standard Test Method for Measurement of Radio Frequency Induced Heating On or Near Passive Implants During Magnetic Resonance Imaging [guideline]
  ASTM, ASTM F2182-19e2: 1-11
• 2018
  IEEE Standard for Radio-Frequency Energy and Current-Flow Symbols [guideline]
  Institute of Electrical and Electronics Engineers (IEEE), IEEE C95.2-2018: 1-28
• 2016, Chen HY, Wen SH
  Evaluation of E-Field Distribution and Human Exposure for a LTE Femtocell in an Office [tech./dosim.]
  Appl Comput Electromagn Soc J 31 (4): 455-467
• 2016, Madjar HM
  [details] Human radio frequency exposure limits: An update of reference levels in Europe, USA, Canada, China, Japan and Korea [review]
  2016 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Wroclaw, Poland. IEEE: 467-473; ISBN 978-1-5090-1417-0
• 2016, Yahya SI, Whittow WG, Khaleel YA
  Numerical dosimetry of CDMA/GSM, DCS/PCS and 3G signal jammers [tech./dosim.]
  IET Microwaves, Antennas & Propagation 10 (8): 827-835
• 2016, Teixeira TA, Hasan SF
  Assessing electromagnetic radiation in our environment [tech./dosim.]
  IEEE Potentials 35 (2): 22-25