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2018,
Shkliarskyi V, Matiieshyn Y, Grytsay V, Smarkutskyi T, Shckorbatov Y
2018 14th International Conference on Advanced Trends in Radioelecrtronics, Telecommunications and Computer Engineering (TCSET), Lviv-Slavske, Ukraine. IEEE: 728-731; ISBN 978-1-5386-2557-6
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2018,
Vrba J, Vrba Jr J, Vrba D, Merunka I, Fiser O
2018 Progress in Electromagnetics Research Symposium (PIERS-Toyama), Toyama, Japan. IEEE: 1028-1033; ISBN 978-1-5386-5455-2
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2018,
Infante P, Tumalli L, Flores T, Gilart F
2017 IEEE 37th Central America and Panama Convention (CONCAPAN XXXVII), Managua, Nicaragua. IEEE: 1-7; ISBN 978-1-5386-3510-0
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2018,
Marrella A, Iafisco M, Adamiano A, Rossi S, Aiello M, Barandalla-Sobrados M, Carullo P, Miragoli M, Tampieri A, Scaglione S, Catalucci D
J R Soc Interface 15 (144): 20180236
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2018,
McDermott B, Porter E, Hughes D, McGinley B, Lang M, O'Halloran M, Jones M
J Alzheimers Dis 65 (2): 363-392
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2018,
Wang M, Yang Z, Wu J, Bao J, Liu J, Cai L, Dang T, Zheng H, Li E
IEEE Trans Antennas Propag 66 (6): 3076 - 3086
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2018,
Ali IH, Hamd HI, Abdalla AI
2018 Advances in Science and Engineering Technology International Conferences (ASET), Dubai, Sharjah, Abu Dhabi, United Arab Emirates. IEEE: 1-5; ISBN 978-1-5386-2400-5
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2018,
Salam MA, Wen F, Ismit H, Rahman QM, Hasan S
2018 5th International Conference on Electrical and Electronic Engineering (ICEEE), Istanbul, Turkey. IEEE: 293-296; ISBN 978-1-5386-6393-6
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2018,
Sadamitsu S, Leung SW, Lo WK, Sun WN
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE: 28-31; ISBN 978-1-5090-3955-5
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2018,
Chiaramello E, Parazzini M, Fiocchi S, Bonato M, Ravazzani P, Wiart J
2018 2nd URSI Atlantic Radio Science Meeting (AT-RASC), Gran Canaria, Spain. IEEE: 1-4; ISBN 978-1-5386-3764-7
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2018,
Kamimura Y, Inagaki S, Wake K
2018 International Symposium on Electromagnetic Compatibility (EMC EUROPE), Amsterdam, Netherlands. IEEE: 855-859; ISBN 978-1-4673-9699-8
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2018,
Piper S, Ball L, Mandziuk M
2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI), Long Beach, CA, USA. IEEE: 448-453; ISBN 978-1-5386-6622-7
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2018,
Haridim M, Hilly O, Levi L, Lesnik R, Milgrom B
2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO), Reykjavik, Iceland. IEEE: 1-3; ISBN 978-1-5386-5205-3
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2018,
Korzeniewska E, Krawczyk A, Lada-Tondyra E
2018 Applications of Electromagnetics in Modern Techniques and Medicine (PTZE), Racławice, Poland. IEEE: 125-128; ISBN 978-1-5386-6937-2
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2018,
Belrhiti L, Riouch F, Tribak A, Terhzaz J, Bouyahyaoui A, Sanchez AM
2018 6th International Conference on Multimedia Computing and Systems (ICMCS), Rabat, Morocco. IEEE: 1-6; ISBN 978-1-5386-6221-2
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2018,
Periyasamy M, Dhanasekaran R, Mahendran G
2018 International Conference on Communication and Signal Processing (ICCSP), Chennai, India. IEEE: 906-910; ISBN 978-1-5386-3522-3
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2018,
Taguchi K, Laakso I, Aga K, Hirata A, Diao Y, Chakarothai J, Kashiwa T
IEEE Access 6: 70186 - 70196
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2018 Open Innovations Conference (OI), Johannesburg, South Africa. IEEE: 170-175; ISBN 978-1-5386-5319-7
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2018,
Bouleanu I, Miclaus S, Bechet AC, Bechet P, Sarbu A, Helbet R
2018 International Conference on Applied and Theoretical Electricity (ICATE), Craiova, Romania. IEEE: 1-4; ISBN 978-1-5386-3807-1
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2018,
Mohammad M, Haque MS, Choi S
2018 IEEE Energy Conversion Congress and Exposition (ECCE), Portland, OR, USA. IEEE: 97-104; ISBN 978-1-4799-7313-2
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2018,
Bejenaru O, Lazarescu C, Vornicu S, David V
2018 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: 1004-1009; ISBN 978-1-5386-5063-9
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2018,
Pavel I, David V, Podaru AC
2018 International Conference and Exposition on Electrical And Power Engineering (EPE), Iasi, Romania. IEEE: 572-577; ISBN 978-1-5386-5063-9
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2018,
Ibrahim AU, Zhong W, Cui H, Xu D
2018 IEEE International Power Electronics and Application Conference and Exposition (PEAC), Shenzhen, China. IEEE: 1-6; ISBN 978-1-5386-6055-3
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2018,
Muthalaly RG, Nerlekar N, Ge Y, Kwong RY, Nasis A
Radiology 289 (2): 281-292
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2018,
Sasaki K, Nishikata A, Watanabe S, Fujiwara O
Phys Med Biol 63 (20): 205008