-
2022,
Wang XY, Mei N, Fan X, Wang X, Gao H, Huang YD
2022 International Applied Computational Electromagnetics Society Symposium (ACES-China), Xuzhou, China. IEEE: 1-3; ISBN 978-1-6654-5237-3
-
2022,
Ibrahim A, Razali AR, Jusoh M, Faudzi NM, Mozi AM
2022 IEEE International RF and Microwave Conference (RFM), Kuala Lumpur, Malaysia. IEEE: 1-4; ISBN 978-1-6654-8978-2
-
2022 International Applied Computational Electromagnetics Society Symposium (ACES-China), Xuzhou, China. IEEE: 1-3; ISBN 978-1-6654-5237-3
-
2022 IEEE International RF and Microwave Conference (RFM), Kuala Lumpur, Malaysia. IEEE: 1-4; ISBN 978-1-6654-8978-2
-
2022,
Bräunlich R, Dalmus C, Dongus S, Eberhard J, Friedrich G, Fröhlich J, Röösli M, Schürmann D
Swiss Federal Office of Energy (SFOE),
Statusbericht 2022: 1-204
-
2022,
Grünwald R, Revermann C, Riousset P
Büro für Technikfolgen-Abschätzung beim Deutschen Bundestag (TAB),
Arbeitsbericht Nr. 196: 1-432
-
2022,
Takahashi R, Yukita W, Yokota T, Someya T, Kawahara Y
Barbosa S, Lampe C, Appert C, Shamma DA, Drucker S, Williamson J, Yatani K (eds.): Proceedings of the 2022 CHI Conference on Human Factors in Computing Systems (CHI' 22). Association for Computing Machinery, New York; 1-12; ISBN 978-1-4503-9157-3
-
2022,
Ben Saada A, Ben Mbarek S, Choubani F
Barolli L, Hussain F, Enokido T (eds.): Advanced Information Networking and Applications. Lecture Notes in Networks and Systems, volume 449; Springer, Cham; 471-478; ISBN 978-3-030-99583-6
-
2022,
Petroulakis N, Chatziadam P, Mattsson MO, Simko M, Theodorou V, Yiorkas AM, Gavrielides A, Miaoudakis A, Scarfi MR, Zeni O
2022 IEEE Conference on Standards for Communications and Networking (CSCN), Thessaloniki, Greece. IEEE: 42-47; ISBN 978-1-6654-7622-5
-
EMIE 2022; The 2nd International Conference on Electronic Materials and Information Engineering, Hangzhou, China. VDE: 1-6; ISBN 978-3-8007-5961-3
-
2022,
Andrews D, Blackhurst EJ, Salmon NA
Buller GS, Hollins RC, Lamb RA, Laurenzis M (eds.): Emerging Imaging and Sensing Technologies for Security and Defence VII. Proceedings of SPIE, volume 12274; SPIE, Bellingham; 122740K
-
2022,
Asok AO, Vidhya JS, Babu FB, Dey S, Kunju N
2022 IEEE 19th India Council International Conference (INDICON), Kochi, India. IEEE: 1-4; ISBN 978-1-6654-5272-4
-
2022,
Annalakshmi N, Umarani S
2022 1st International Conference on Computational Science and Technology (ICCST), CHENNAI, India. IEEE: 701-707; ISBN 978-1-6654-7656-0
-
2022,
Jeladze V, Shoshiashvili L, Partsvania B
2022 IEEE 2nd Ukrainian Microwave Week (UkrMW), Ukraine. IEEE: 477-481; ISBN 9798350331530
-
2022,
Nozadze T, Henke K, Kurtsikidze M, Jeladze V, Ghvedashvili G, Zaridze R
2022 IEEE 2nd Ukrainian Microwave Week (UkrMW), Ukraine. IEEE: 439-443; ISBN 9798350331530
-
French Agency for Food, Environmental and Occupational Health & Safety (ANSES),
ANSES Opinion, Request No 2019-SA-0006: 1-25
-
Panagopoulos DJ (ed.): CRC Press, Boca Raton; ISBN 978-1-032-06175-7
-
2022 International Conference on Computing, Communication, and Intelligent Systems (ICCCIS), Greater Noida, India. IEEE: 383-388; ISBN 978-1-6654-6201-3
-
2022,
Derat B, Celik M, Wittmann M, El Hajj W, Colombi D
2022 Antenna Measurement Techniques Association Symposium (AMTA), Denver, CO, USA. IEEE: 1-6; ISBN 978-1-6654-8427-5
-
2022,
Kaschel H, Ahumada C
2022 IEEE International Conference on Automation/XXV Congress of the Chilean Association of Automatic Control (ICA-ACCA), Curicó, Chile. IEEE: 1-5; ISBN 978-1-6654-9409-0
-
2022,
Mallavarapu S, Lokam A, Farooq U
2022 IEEE International Symposium on Smart Electronic Systems (iSES), Warangal, India. IEEE: 175-179; ISBN 9798350399233
-
2022,
Gong LF, Liu XZ, Zhang HH, Xu YX, Zheng C, Han YJ
2022 International Conference on Microwave and Millimeter Wave Technology (ICMMT), Harbin, China. IEEE: 1-3; ISBN 978-1-6654-8227-1
-
2022,
Ivanova M, Barudov E
2022 14th Electrical Engineering Faculty Conference (BulEF), Varna, Bulgaria. IEEE: 1-4; ISBN 978-1-6654-9027-6
-
2022,
Emhemmed AS, Abougarair AJ, Salih O, Alsamlqi SS
2022 IEEE 21st international Ccnference on Sciences and Techniques of Automatic Control and Computer Engineering (STA), Sousse, Tunisia. IEEE: 18-23; ISBN 978-1-6654-8262-2
-
2022,
Matveev I, Zhorina L, Shishkin Y
2022 IEEE International Multi-Conference on Engineering, Computer and Information Sciences (SIBIRCON), Yekaterinburg, Russian Federation. IEEE: 440-445; ISBN 978-1-6654-6481-9