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2019,
Chen C, Fang Y, Wang X, Bao SC, Tang Z, Tong RK
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: 6884-6887, ISBN 9781538613122
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2019,
Khan A, Haueisen J, Wolters CH, Antonakakis M, Vogenauer N, Wollbrink A, Suntrup-Krueger S, Schneider TR, Herrmann CS, Nitsche M, Paulus W
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: 5894-5897, ISBN 9781538613122
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2019,
Colella M, Laher RM, Press DZ, McIlduff CE, Rutkove SB, Pascual-Leone A, Apollonio F, Liberti M, Bonmassar G
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: 3987-3990, ISBN 9781538613122
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2019,
Callejon-Leblic MA, Miranda PC
2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Berlin, Germany. IEEE: 5913-5917, ISBN 9781538613122
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2019 International Engineering Conference (IEC), Erbil, Iraq IEEE: 28-33, ISBN 9781728143781
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2019,
Judáková Z, Janoušek L
2019 IEEE 20th International Conference on Computational Problems of Electrical Engineering (CPEE), Lviv-Slavske, Ukraine. IEEE: 1-4, ISBN 9781728128115
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2019,
Liu B, Ouyang Z, Li P, Qu Y, Wu T, Wei Z
2019 22nd International Conference on Electrical Machines and Systems (ICEMS), Harbin, China IEEE: 1-5, ISBN 9781728133997
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2019,
Sekiba Y, Yamazaki K
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), Sapporo, Japan IEEE: 83-86, ISBN 9781728116396
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2019,
He Y, Leung PSW, Chow Y, Diao Y
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), Sapporo, Japan IEEE: 750-753, ISBN 9781728116396
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2019,
Rahman NAA, Jamil MMA, Adon MN
2019 IEEE 10th Control and System Graduate Research Colloquium (ICSGRC), Shah Alam, Malaysia IEEE: 100-103, ISBN 9781728107561