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2022,
Mustafa BT, Yaba SP, Ismail AH
2022 8th International Engineering Conference on Sustainable Technology and Development (IEC), Erbil, Iraq. IEEE: pp. 53-57; ISBN 978-1-6654-7830-4
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2021,
Voloshyn Y, Kulish S, Oliynyk VM
2021 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems (COMCAS), Tel Aviv, Israel. IEEE: pp. 431-437; ISBN 978-1-6654-1147-9
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2021,
Jiang W, Isenhart R, Kistler N, Lu Z, Xu H, Lee DJ, Liu CY, Song D
2021 43rd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Mexico. IEEE: pp. 6318-6321; ISBN 978-1-7281-1179-7
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2021,
Luo F, Zhang J, Huang L, Yang C, Yu W, Meng J
2021 IEEE 4th International Conference on Electronic Information and Communication Technology (ICEICT), Xi'an, China. IEEE: pp. 610-612; ISBN 978-1-6654-3204-7
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2021,
Lin J, Li J, Ding G, Xu S, He W
2021 4th International Conference on Energy, Electrical and Power Engineering (CEEPE), Chongqing, China. IEEE: pp. 616-620; ISBN 978-1-6654-3364-8
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2021,
Perret D, Kim DS, Li KW, Luo ZD
Luo ZD (ed.): Pain Research. Methods in Molecular Biology, volume 851; Humana Press, Totowa; pp. 275-284; ISBN 978-1-61779-560-2
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2020,
Mustafa BT, Yaba SP, Ismail AH
Hashim JH (ed.): The 8th International Conference on Applied Science and Technology (ICAST 2020), Karbala, Iraq, 15-16 April 2020. AIP Conference Proceedings, volume 2290; AIP Publishing, Melville, New York; p. 050007; ISBN 978-0-7354-4020-3
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2020,
Paras S, Vojinovic N, Amidzic L
Badnjevic A, Škrbić R, Gurbeta Pokvić L (eds.): CMBEBIH 2019: Proceedings of the International Conference on Medical and Biological Engineering, 16 ̶̶ 18 May 2019, Banja Luka, Bosnia and Herzegovina. IFMBE Proceedings, volume 73; Springer, Cham; pp. 37-42; ISBN 978-3-030-17970-0
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2020,
Drobakhin O, Magro V, Kosharnyi V, Rutgaizer V, Abdul-Ohly L
2020 IEEE Ukrainian Microwave Week (UkrMW), Kharkiv, Ukraine. IEEE: pp. 586-589; ISBN 978-1-7281-7314-6
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2020,
Wang S, Xie Y, Shang S, Hao X, Lu X
2020 6th Global Electromagnetic Compatibility Conference (GEMCCON), XI'AN, China. IEEE: pp. 1-5; ISBN 978-1-7281-8464-7