The following terms were included:
threshold, Schwellenwert, "threshold value", 閾値
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2024,
Ismail E, El-diasty S, Sree MFA, Aboul-Dahab M
2024 6th International Youth Conference on Radio Electronics, Electrical and Power Engineering (REEPE), Moscow, Russian Federation. IEEE: 1-6; ISBN 9798350382907
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2024,
SSM’s Scientific Council on Electromagnetic Fields, Dasenbrock C, Poulsen AH, Danker-Hopfe H, Huss A, Poulletier de Gannes F, Scarfi MR, Röösli M, van Rongen E
Swedish Radiation Safety Authority (SSM),
Report number: 2024:05: 1-122
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2023,
Zhang H, Liao M, He L, Lee CK
2023 IEEE International Future Energy Electronics Conference (IFEEC), Sydney, Australia. IEEE: 199-202; ISBN 9798350339895
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2023,
Arkan FB, Naufal Arifin M, Pamungkas W, Nur LO, Setia Nugroho B, Ryanu HH
2023 IEEE International Symposium On Antennas And Propagation (ISAP), Kuala Lumpur, Malaysia. IEEE: 1-2; ISBN 9798350341157
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2023,
Zinno C, Agnesi F, Bernini F, Gabisonia K, Terlizzi D, Recchia FA, Lionetti V, Micera S
2023 45th Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Sydney, Australia. IEEE: 1-4; ISBN 9798350324488
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2023,
Galanis C, Neuhaus L, Hananeia N, Turi Z, Jedlicka P, Vlachos A
bioRxiv: the Preprint Server for Biology (bioRxiv),
2023.09.25.559399
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2023,
Ikehata M, Suzuki Y, Kamijyo T, Kik A, Yoshie S, Tasaki T, Kojima M, Sasaki H
2023 XXXVth General Assembly and Scientific Symposium of the International Union of Radio Science (URSI GASS), Sapporo, Japan. IEEE: 1-2; ISBN 9798350309973
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2023,
Mahapatra S, Satrusallya S, Mohanty MN
2023 International Conference on Microwave, Optical, and Communication Engineering (ICMOCE), Bhubaneswar, India. IEEE: 1-4; ISBN 9798350321616
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2023,
Salma S, Khan H, Madhav BTP, Sathwik B, Praveen Koushik SSD, Arun Harsha Vardhan P
2023 Second International Conference on Electrical, Electronics, Information and Communication Technologies (ICEEICT), Trichirappalli, India. IEEE: 1-5; ISBN 9798350397642
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2022,
Ma F, Liu X, Ansari N
GLOBECOM 2022 - 2022 IEEE Global Communications Conference, Rio de Janeiro, Brazil. IEEE: 4995-5000; ISBN 978-1-6654-3541-3