[医療機器の検査時の電磁界ばく露のタイムドメインモニタリング] tech./dosim.

Time-domain monitoring of EM exposure during medical device testing

著者: Attaran A, Handler WB, Menon RS, Chronik BA
掲載誌: 2017 IEEE 30th Canadian Conference on Electrical and Computer Engineering (CCECE), Windsor, ON, Canada. IEEE, 2017; ISBN 978-1-5090-5539-5
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