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Institute of Electrical and Electronics Engineers (IEEE),
IEEE Std C95.1-2019/Cor 2-2020: 1-15, ISBN 978-1-5044-7055-1
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2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5580-7
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2020,
Poljak D, Cvetković M
2020 5th International Conference on Smart and Sustainable Technologies (SpliTech), Split, Croatia. IEEE: 1-4; ISBN 978-1-7281-7363-4
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2020,
Susnjara A, Poljak D
2020 International Conference on Software, Telecommunications and Computer Networks (SoftCOM), Split, Hvar, Croatia. IEEE: 1-5; ISBN 978-1-7281-7538-6
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2020,
Judakova Z, Janousek L
2020 IEEE 21st International Conference on Computational Problems of Electrical Engineering (CPEE), Pińczów, Poland. IEEE: 1-4; ISBN 978-1-7281-9618-3
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2020,
Chiaramello E, Tognola G, Bonato M, Gallucci S, Magne I, Souques M, Fiocchi S, Parazzini M, Ravazzani P
2020 XXXIIIrd General Assembly and Scientific Symposium of the International Union of Radio Science, Rome, Italy. IEEE: 1-4; ISBN 978-1-7281-5690-3
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2020,
Brenner B, Majano D
2020 IEEE IAS Electrical Safety Workshop (ESW), Reno, NV, USA. IEEE: 1-5; ISBN 978-1-7281-6439-7
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2020,
Qiu S, Wang S, Yi W, Zhang C, He H
2020 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), Montreal, QC, Canada. IEEE: 3549-3552; ISBN 978-1-7281-1991-5
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2020,
Carciofi C, Garzia A, Valbonesi S, Gandolfo A, Franchelli R
2020 International Conference on Technology and Entrepreneurship (ICTE), Bologna, Italy. IEEE: 1-6; ISBN 978-1-7281-4903-5
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2020,
Buyakova NV, Kryukov AV, Seredkin DA
2020 International Ural Conference on Electrical Power Engineering (UralCon), Chelyabinsk, Russia. IEEE: 76-81; ISBN 978-1-7281-6210-2
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2020,
Klapper U, Burtscher M
2020 IEEE IAS Electrical Safety Workshop (ESW), Reno, NV, USA. IEEE: 1-4; ISBN 978-1-7281-6439-7
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2020,
Liu B, Guo L, Zhang J, Chen X, Huang J, Ma Y, Zhou L
2020 5th Asia Conference on Power and Electrical Engineering (ACPEE), Chengdu, China. IEEE: 1568-1572; ISBN 978-1-7281-5282-0
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2020,
Bonato M, Chiaramello E, Fiocchi S, Gallucci S, Dossi L, Tognola G, Ravazzani P, Parazzini M
2020 IEEE 20th Mediterranean Electrotechnical Conference ( MELECON), Palermo, Italy. IEEE: 429-433; ISBN 978-1-7281-5201-1
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2020,
Cui J, Jiang W, Lei X, Zhang B
2020 5th Asia Conference on Power and Electrical Engineering (ACPEE), Chengdu, China. IEEE: 1563-1567; ISBN 978-1-7281-5282-0
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2020,
Song H, Yan Y, Song Z, Tian F, Li Y, Li F
2020 IEEE 3rd International Conference on Electronics Technology (ICET), Chengdu, China. IEEE: 531-535; ISBN 978-1-7281-6284-3
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2020,
Song H, Yan Y, Song Z, Tian F, Li Y, Li F
2020 IEEE 3rd International Conference on Electronics Technology (ICET), Chengdu, China. IEEE: 503-507; ISBN 978-1-7281-6284-3
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2020,
Buyakova N, Kryukov A, Seredkin D
2020 International Conference on Industrial Engineering, Applications and Manufacturing (ICIEAM), Sochi, Russia. IEEE: 1-6; ISBN 978-1-7281-4591-4
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Directorate-General for European Parliamentary Research Services (EPRS),
1-11
-
2020,
SSM’s Scientific Council on Electromagnetic Fields
Swedish Radiation Safety Authority (SSM),
Report number: 2020:04: 1-82
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2020,
Baaken D, Dechent D, Drießen S, Merzenich H
Federal Office for Radiation Protection (BfS),
Ressortforschungsberichte zur kerntechnischen Sicherheit und zum Strahlenschutz, BfS-RESFOR-156/20: 1-108
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Turksen K (ed.): Cell Biology and Translational Medicine, Volume 7. Advances in Experimental Medicine and Biology, 1237巻; Springer, New York; 135-149; ISBN 978-3-030-37844-8
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StatPearls
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2020,
Gerke M, de Ridder M, Mehnert C, Vogel E, Hoffmann M, Kurz T
State Office for the Environment of the Federal State of Baden-Württemberg (LUBW), Bavarian State Office for the Environment (LfU),
4. aktualisierte Auflage: 1-140
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2019,
Oravec M, Kulikov A, Jurc D, Kulikova O, Vahovsky J, Abraham M
2019 IEEE 17th World Symposium on Applied Machine Intelligence and Informatics (SAMI), Herlany, Slovakia. IEEE: 89-94; ISBN 978-1-7281-0251-1
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2019,
Beniuga O, Dirlau ID, Astanei D, Burlica R
2019 8th International Conference on Modern Power Systems (MPS), Cluj Napoca, Romania. IEEE: 1-4; ISBN 978-1-7281-0751-6