2006,
Beard BB, Kainz W, Onishi T, Iyama T, Watanabe S, Fujiwara O, Wang J, Bit-Babik G, Faraone A, Wiart J, Christ A, Kuster N, Lee AK, Kroeze H, Siegbahn M, Keshvari J, Abrishamkar H, Simon W, Manteuffel D, Nikoloski N
IEEE 6th International Symposium on Electromagnetic Compatibility and Electromagnetic Ecology, 2005, St. Petersburg, Russia. IEEE: 9-14; ISBN 978-0-7803-9374-5