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2023,
Jamshed MA, Khan WU, Pervaiz H, Imran MA, Ur Rehman M
Low Electromagnetic Field Exposure Wireless Devices: Fundamentals and Recent Advances. Ur Rehman M, Jamshed MA (eds.): Wiley-IEEE Press: 213-224, ISBN 978-1-119-90916-3
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2023,
Qureshi MRA, Alfadhl Y, Chen X
Low Electromagnetic Field Exposure Wireless Devices: Fundamentals and Recent Advances. Ur Rehman M, Jamshed MA (eds.): Wiley-IEEE Press: 49-75, ISBN 978-1-119-90916-3
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2023,
Jamshed MA, Héliot F, Brown TWC
Low Electromagnetic Field Exposure Wireless Devices: Fundamentals and Recent Advances. Ur Rehman M, Jamshed MA (eds.): Wiley-IEEE Press: 187-211, ISBN 978-1-119-90916-3
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2023,
Jamshed MA, Brown TWC, Héliot F
Low Electromagnetic Field Exposure Wireless Devices: Fundamentals and Recent Advances. Ur Rehman M, Jamshed MA (eds.): Wiley-IEEE Press: 115-134, ISBN 978-1-119-90916-3
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Low Electromagnetic Field Exposure Wireless Devices: Fundamentals and Recent Advances. Ur Rehman M, Jamshed MA (eds.): Wiley-IEEE Press: 19-47, ISBN 978-1-119-90916-3
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2022,
Badwey MA, Abbasy NH, Eldallal GM
2022 23rd International Middle East Power Systems Conference (MEPCON), Cairo, Egypt. IEEE: 1-8, ISBN 978-1-6654-6364-5
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2022 IEEE International Multi-Conference on Engineering, Computer and Information Sciences (SIBIRCON), Yekaterinburg, Russian Federation. IEEE: 500-503, ISBN 978-1-6654-6481-9
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2022,
Matveev I, Zhorina L, Shishkin Y
2022 IEEE International Multi-Conference on Engineering, Computer and Information Sciences (SIBIRCON), Yekaterinburg, Russian Federation. IEEE: 440-445, ISBN 978-1-6654-6481-9
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2022,
Kundenko M, Chaly I, Vakhonina L, Megel Y, Rudenko A, Mardziavko V
2022 XXXII International Scientific Symposium Metrology and Metrology Assurance (MMA). IEEE: 1-4, ISBN 978-1-6654-8570-8
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2022,
Novotny DR, Christensen N, Kothari S, Langiewicz L
2022 IEEE International Symposium on Product Compliance Engineering (ISPCE), San Diego, CA, USA. IEEE: 1-6, ISBN 978-1-6654-9789-3