By:
Abdul-Al M, Amar ASI, Elfergani I, Littlehales R, Ojaroudi Parchin N, Al-Yasir Y, See CH, Zhou D, Zainal Abidin Z, Alibakhshikenari M, Zebiri C, Elmegri F, Abusitta M, Ullah A, Abdussalam FMA, Rodriguez J, McEwan NJ, Noras JM, Hodgetts R, Abd-Alhameed RA
Published in: Electronics 2022; 11 (4): 511
