Computational Assessment of RF Exposure Levels due to 5G Mobile Phones tech./dosim.

By: Bonato M, Dossi L, Fiocchi S, Gallucci S, Benini M, Chiaramello E, Tognola G, Parazzini M
Published in: 2022 Microwave Mediterranean Symposium (MMS), Pizzo Calabro, Italy. IEEE, 2022: 1-4; ISBN 978-1-6654-7111-4
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Exposure