The scaled SAM models and SAR for handset exposure at 835 MHz tech./dosim.

By: Lee AK, Choi HD, Choi JI, Pack JK
Published in: IEEE MTT-S International Microwave Symposium Digest, 2005, Long Beach, CA, USA. IEEE, 2005: 1323-1326; ISBN 978-0-7803-8845-1
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Exposure