By:
Zucca M, Loader B, Schmidt M, Welinder J, Tammi K, Bruna Romero J, Pichon L, Freschi F, Bauer P, Blandow V, Maffucci A, Femia N, Kuster N
Published in: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018), Paris, France. IEEE, 2018: 1-2; ISBN 978-1-5386-2130-1
