Challenges in Risk-based EMC for MRI Systems basics

By: Vélez RS, van Helvoort MJAM, Vogt-Ardatjew R, Van den Berg B, Leferink F
Published in: 2023 International Symposium on Electromagnetic Compatibility – EMC Europe, Krakow, Poland. IEEE, 2023: 1-6; ISBN 9798350324013
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