Analysis of Exposure to Electromagnetic Fields Due to Multiple Sources in a Classroom Environment
tech./dosim.
By:
Soares NE, Bulla G, Fernandez-Rodriguez CE, De Salles ÁAA
Published in: 2023 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference (IMOC), Castelldefels, Spain. IEEE, 2023: 28-30; ISBN 9798350320688
