-
2022,
Ibrahim A, Tetik E, Karamzadeh S
2022 30th Signal Processing and Communications Applications Conference (SIU), Safranbolu, Turkey. IEEE: 1-4; ISBN 978-1-6654-5093-5
-
2022 IEEE 22nd International Conference on Communication Technology (ICCT), Nanjing, China. IEEE: 706-711; ISBN 978-1-6654-7068-1
-
2022,
Gökdemir M, Saeidi T, Karamzadeh S, Akleman F
2022 30th Signal Processing and Communications Applications Conference (SIU), Safranbolu, Turkey. IEEE: 1-4; ISBN 978-1-6654-5093-5
-
2022,
Ali K, Cosmas J, Zhang Y, Zhang H, Meunier B, Jawad N, Zhang X, Shi L, Gbadamosi J, Savov A
IEEE Trans Broadcast 68 (1): 156-170
-
2022,
Ursăchianu MV, Lăzărescu C, Bejenaru O, Sălceanu A
IOP Conf Ser Mater Sci Eng 1254: 012026
-
2022,
Mishra P, Jain P, Singh MP, Ghosh S
2022 URSI Regional Conference on Radio Science (USRI-RCRS), Indore, India. IEEE: 1-4; ISBN 978-1-6654-5359-2
-
2022,
Jain A, Mishra A, Dubey SK
2022 URSI Regional Conference on Radio Science (USRI-RCRS), Indore, India. IEEE: 1-4; ISBN 978-1-6654-5359-2
-
2022,
Ibrahim A, Razali AR, Jusoh M, Faudzi NM, Mozi AM
2022 IEEE International RF and Microwave Conference (RFM), Kuala Lumpur, Malaysia. IEEE: 1-4; ISBN 978-1-6654-8978-2
-
2022,
Ben Saada A, Ben Mbarek S, Choubani F
Barolli L, Hussain F, Enokido T (eds.): Advanced Information Networking and Applications. Lecture Notes in Networks and Systems, volume 449; Springer, Cham; 471-478; ISBN 978-3-030-99583-6
-
2022,
Jeladze V, Shoshiashvili L, Partsvania B
2022 IEEE 2nd Ukrainian Microwave Week (UkrMW), Ukraine. IEEE: 477-481; ISBN 9798350331530
-
2022,
Derat B, Celik M, Wittmann M, El Hajj W, Colombi D
2022 Antenna Measurement Techniques Association Symposium (AMTA), Denver, CO, USA. IEEE: 1-6; ISBN 978-1-6654-8427-5
-
2022,
Miclaus S, Deaconescu DB, Vatamanu D, Buda AM
2022 International Symposium on Electronics and Telecommunications (ISETC), Timisoara, Romania. IEEE: 1-4; ISBN 978-1-6654-5151-2
-
2022,
Miura N, Kodera S, Higashiyama J, Iyama T, Suzuki Y, Hirata A
2022 Asia-Pacific Microwave Conference (APMC), Yokohama, Japan. IEEE: 423-425; ISBN 978-1-6654-5108-6
-
2022,
Ahumada C, Kaschel H, Cordero S, Osorio-Comparan R
2022 IEEE International Conference on Automation/XXV Congress of the Chilean Association of Automatic Control (ICA-ACCA), Curicó, Chile. IEEE: 1-5; ISBN 978-1-6654-9409-0
-
2022,
Gallucci S, Bonato M, Benini M, Chiaramello E, Fiocchi S, Tognola G, Parazzini M
Sensors 23 (1): 104
-
2022,
Luo S, Wang Z, Wang H, Chen S
2022 6th International Conference on Communication and Information Systems (ICCIS), Chongqing, China. IEEE: 27-34; ISBN 978-1-6654-6386-7
-
2022 6th International Conference on Communication and Information Systems (ICCIS), Chongqing, China. IEEE: 1-6; ISBN 978-1-6654-6386-7
-
2022,
Sekiya K, Ishii N, Shimizu Y, Nagaoka T
2022 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition (iWEM), Narashino, Japan. IEEE: 79-80; ISBN 978-1-6654-3239-9
-
2022,
Yamamoto K, Hikage T, Masuda H, Ishitake T, Li K, Nagai A
2022 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition (iWEM), Narashino, Japan. IEEE: 37-38; ISBN 978-1-6654-3239-9
-
2022,
Castellanos G, De Gheselle S, Martens L, Kuster N, Joseph W, Deruyck M, Kuehn S
Comput Netw 216: 109255
-
2022,
Wydaeghe R, Shikhantsov S, Tanghe E, Vermeeren G, Martens L, Demeester P, Joseph W
IEEE Access 10: 130996-131004
-
2022,
Umamaheswari G, Praveena A
2022 International Conference on Intelligent Innovations in Engineering and Technology (ICIIET), Coimbatore, India. IEEE: 118-123; ISBN 978-1-6654-5654-8
-
2022,
Salem MA, Lim HS, Chua MY, Chien SF, Zarakovitis CC, Ng CY, Abd Rahman NZ
Int J Technol 13 (6): 1298-1307
-
2022,
Sali A, Wali SQ, Osman AF
2022 IEEE 6th International Symposium on Telecommunication Technologies (ISTT), Johor Bahru, Malaysia. IEEE: 16-21; ISBN 978-1-6654-8943-0
-
2022,
Fontá Romero C, Auñón Marugán A, Rodríguez Varela F, Bielza López P, Alcolea Coronel JL, Alonso Montes JI, Sierra Castañer M
2022 Antenna Measurement Techniques Association Symposium (AMTA), Denver, CO, USA. IEEE: 1-5; ISBN 978-1-6654-8427-5