electron microscopy

German: Elektronenmikroskopie
Japanese: 電子顕微鏡法

Physics. Acronym EM. A technique that uses an electron beam, focused by electron lenses, to magnify tiny objects onto a fluorescent screen or photographic plate (magnification up to 1,000,000 times). The final picture is derived either from the diffraction and adsorption of electrons passing through the investigated object (transmission electron microscopy) or from the electrons scattered and reflected by the object's surface (scanning electron microscopy).

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