RF exposure analysis for multiple Wi-Fi devices in enclosed environment tech./dosim.

By: Hwu SU, Rhodes BA, de Silva BK, Sham CC, Keiser JR
Published in: 2013 IEEE Sensors Applications Symposium Proceedings, Galveston, TX, USA. IEEE, 2013: 13430153; ISBN 978-1-4673-4636-8
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Exposure