Precise E-field measurement inside TEM cell at GSM frequencies using microstrip E-field probe tech./dosim.

By: Narang N, Dubey SK, Negi PS, Ojha VN
Published in: 2016 International Conference on Signal Processing and Communication (ICSC), Noida, India. IEEE, 2016; ISBN 978-1-5090-2685-2
Download citation in RIS format

Exposure