[マイクロストリップ電界プローブを用いたGSM周波数でのTEMセル内部の厳密な電界測定] tech./dosim.

Precise E-field measurement inside TEM cell at GSM frequencies using microstrip E-field probe.

掲載誌: 2016 International Conference on Signal Processing and Communication (ICSC), Noida, India. IEEE, 2016: ISBN 978-1-5090-2685-2

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