Modeling and Measurement of Exposure to Realistic Non-Uniform Electric Fields at 50 Hz
tech./dosim.
By:
Laakso I, Lehtinen T
Published in: 2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC), Sapporo, Japan. IEEE, 2019: 334-337; ISBN 978-1-7281-1639-6
