2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446), Boston, MA, USA. volume 2; IEEE: 543-547; ISBN 978-0-7803-7835-3
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Ruigrok HJ, Arnaud-Cormos D, Hurtier A, Poque E, de Gannes FP, Ruffié G, Bonnaudin F, Lagroye I, Sojic N, Arbault S, Lévêque P, Veyret B, Percherancier Y