The following terms were included:
"Institute of Electrical and Electronics Engineers", IEEE, 米国電気電子学会
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2017,
Tang J, Yin H, Xu J, Bo W, Yang Y, Ma J, Gong Y
2017 42nd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Cancun, Mexico. IEEE, Cancun, Mexico: 1-2; ISBN 978-1-5090-6050-4
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2017,
Yavolovskaya E, Gabriadze G, Chiqovani G, Jobava R
2017 XXIInd International Seminar/Workshop on Direct and Inverse Problems of Electromagnetic and Acoustic Wave Theory (DIPED), Dnipro. IEEE, Dnipro, Ukraine: 183-186; ISBN 978-1-5090-0605-2
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2017,
Haridim M, Keren O, Amitt A, Azadmehr M
2017 11th European Conference on Antennas and Propagation (EUCAP), Paris. IEEE, Paris, France: 2256-2258; ISBN 978-88-907018-7-0
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2017,
Saito K, Akiyama R, Nagaoka T, Watanabe S
2017 International Workshop on Antenna Technology: Small Antennas, Innovative Structures, and Applications (iWAT), Athens, Greece. IEEE: 152-153; ISBN 978-1-5090-5178-6
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2017,
Kisel NN, Cheremisov VA, Kisel DV
2017 Progress In Electromagnetics Research Symposium - Spring (PIERS), St. Petersburg, Russia. IEEE: 3433-3438; ISBN 978-1-5090-6270-6
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2017,
Omi S, Uno T, Arima T, Wiart J
2017 International Symposium on Antennas and Propagation (ISAP), Phuket, Thailand. IEEE: 1-2; ISBN 978-1-5386-0466-3
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2017,
Biswas S, Sikdar D, Das S, Mahadevappa M
2017 39th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC), Jeju, Korea (South). IEEE: 1101-1104; ISBN 978-1-5090-2810-8
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2017,
Hanzelka M, Dan J, Fiala P, Drexler P, Holcner V, Dohnal P
2017 Progress in Electromagnetics Research Symposium - Fall (PIERS - FALL), Singapore. IEEE, Singapore, Singapore: 966-969; ISBN 978-1-5386-1211-8
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2017,
Gercek C, Magne I, Kourtiche D, Schmitt P, Roth P, Nadi M, Souques M
2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE, Angers. IEEE, Angers, France: 1-5; ISBN 978-1-5386-0689-6
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2017,
Gil I, Fernández-García R
2017 Progress In Electromagnetics Research Symposium - Spring (PIERS), St. Petersburg, Russia. IEEE: 655-659; ISBN 978-1-5090-6270-6