The following terms were included:
"Very High Frequency", Ultrakurzwellen, Meterwellen, UKW, VHF
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2018,
Fayed IM, El-Din ES
2017 European Conference on Electrical Engineering and Computer Science (EECS), Bern. IEEE: 449-453; ISBN 978-1-5386-2086-1
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2018,
Sieron K, Sieron A, Cieslar G, Sowa P
2018 Baltic URSI Symposium (URSI), Poznan, Poland. IEEE: 9-10; ISBN 978-1-5386-1360-3
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2018,
Netke B, Dongre S, Bhadouria N, Bhattacharya M
2018 1st International Conference on Multimedia Analysis and Pattern Recognition (MAPR), Ho Chi Minh City. IEEE; ISBN 978-1-5386-4181-1
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2018,
Bragin DE, Bragina OA, Hagberg S, Nemoto EM
Heldt T (ed.): Intracranial Pressure & Neuromonitoring XVI. Acta Neurochirurgica Supplement, volume 126; Springer, Cham; 93-95; ISBN 978-3-319-65797-4
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2017,
Raghu N, Murthy NK, Nagendra K, Trupti VN
Satapathy SC, Prasad VK, Rani BP, Udgata SK, Raju KS (eds.): Proceedings of the First International Conference on Computational Intelligence and Informatics, ICCII 2016. Advances in Intelligent Systems and Computing, volume 507; Springer, Singapore; 625-636; ISBN 978-981-10-2470-2
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2017 IEEE MTT-S International Microwave and RF Conference (IMaRC), Ahmedabad, India. IEEE: 267-270; ISBN 978-1-5386-1321-4
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2017,
Jomaa K, Ndagijimana F, Ayad H, Fadlallah M, Jomaah J
2017 IEEE Applied Electromagnetics Conference (AEMC), Aurangabad, India. IEEE; ISBN 978-1-5386-2394-7
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2017,
Nikitin A, Suhareva D, Mishchenko E, Zubareva A, Shurankova O, Spirov R
2017 International Conference on Electromagnetic Devices and Processes in Environment Protection with Seminar Applications of Superconductors (ELMECO & AoS), Naleczow, Poland. IEEE; ISBN 978-1-5386-1944-5
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2017,
Alborova IL, Bonello J, Farrugia L, Sammut CV, Anishchenko LN
2017 Progress In Electromagnetics Research Symposium - Spring (PIERS), St. Petersburg, Russia. IEEE; ISBN 978-1-5090-6270-6
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2017,
Di Meo S, Massoni E, Silvestri L, Obbad J, Pasian M, Dondi D, Bozzi M, Perregrini L, Alaimo G, Marconi S, Auricchio F
2017 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP), Pavia, Italy. IEEE; ISBN 978-1-5386-0481-6